2

Mechanical stress and electrical resistance of CrSi-O thin films

Year:
1995
Language:
english
File:
PDF, 808 KB
english, 1995
4

Factor analysis and XPS-data preprocessing for non-conducting samples

Year:
1999
Language:
english
File:
PDF, 90 KB
english, 1999
5

Comparison of depth profiling techniques using ion sputtering from the practical point of view

Year:
2003
Language:
english
File:
PDF, 926 KB
english, 2003
6

Resistance behaviour and interdiffusion of layered CuNi-NiCr films

Year:
1995
Language:
english
File:
PDF, 1.01 MB
english, 1995
7

Oxidation behaviour of Cu-Ni(Mn) (constantan) films

Year:
1995
Language:
english
File:
PDF, 795 KB
english, 1995
15

Grammatisches

Year:
1882
File:
PDF, 812 KB
1882
29

X. Zur Inschrift des Soarchos von Lebena

Year:
1897
Language:
german
File:
PDF, 254 KB
german, 1897
30

Nachtrag zu den ’Epigraphischen Kleinigkeiten

Year:
1889
File:
PDF, 148 KB
1889
37

Depth profile and interface analysis in the nm-range

Year:
2005
Language:
english
File:
PDF, 433 KB
english, 2005
38

Oxidation Behaviour of PACVD-(Ti,Al)N Wear Resistance Layers

Year:
2000
Language:
english
File:
PDF, 327 KB
english, 2000
40

AES depth profiling multilayers of 3d transition metals

Year:
2001
Language:
english
File:
PDF, 160 KB
english, 2001
41

Transverse spin asymmetry at the A4 experiment

Year:
2005
Language:
english
File:
PDF, 204 KB
english, 2005
45

Parity violating electron scattering at MAMI

Year:
2012
Language:
english
File:
PDF, 448 KB
english, 2012